Fischer Measurement Technologies (India) Pvt. Ltd. was incorporated in India in April 2006 with its H.O at Pune as 100% subsidiary of Helmut Fischer.
We deliver internationally proven high quality products and services which help to augment and enhance the quality, productivity and reliability of our customer’s end product or services.

Our wide range of EDXRF based instruments can be used for in-line or offline thin film metrology.

We offer Fischer scope Spectrometers for:
• PV thin film characterization.
• Perfect in-line measurement of CIGS, CdTe, 
CIS or CISSe, ITO or TCO
• Determines composition and thickness on
various substrates like glass, thin metals or
plastic foils

For more information on our products please visit us at www.helmutfischer.com